Creep crack growth tests have been made on Jethete M152 at 550°C under initially mixed-mode (i.e. KI/KII≈1.6) and mode-II crack tip conditions using compact mixed-mode (CMM) specimens. The results of these tests have been compared with mode-I data obtained from compact tension (CT) tests, using aC* approach. The correlation between the mode-I, mode-II and mixed-mode data is reasonably good. However, the scatter band is greater than that obtained from the mode-I results only. The results indicate that theC* approach, which has been used successfully in mode-I situations, may also be useful for predicting creep crack growth in more general situations.