High definition aperture probes for near-field optical microscopy fabricated by focused ion beam milling
作者:
J. A. Veerman,
A. M. Otter,
L. Kuipers,
N. F. van Hulst,
期刊:
Applied Physics Letters
(AIP Available online 1998)
卷期:
Volume 72,
issue 24
页码: 3115-3117
ISSN:0003-6951
年代: 1998
DOI:10.1063/1.121564
出版商: AIP
数据来源: AIP
摘要:
We have improved the optical characteristics of aluminum-coated fiber probes used in near-field scanning optical microscopy by milling with a focused ion beam. This treatment produces a flat-end face free of aluminum grains, containing a well-defined circularly-symmetric aperture with controllable diameter down to 20 nm. The polarization behavior of the tips is circularly symmetric with a polarization ratio exceeding 1:100. The improved imaging characteristics are demonstrated by measuring single molecule fluorescence. Count rates increase more than one order of magnitude over unmodified probes, and the molecule images map a spatial electric field distribution of the aperture in agreement with calculations. ©1998 American Institute of Physics.
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