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High definition aperture probes for near-field optical microscopy fabricated by focused ion beam milling

 

作者: J. A. Veerman,   A. M. Otter,   L. Kuipers,   N. F. van Hulst,  

 

期刊: Applied Physics Letters  (AIP Available online 1998)
卷期: Volume 72, issue 24  

页码: 3115-3117

 

ISSN:0003-6951

 

年代: 1998

 

DOI:10.1063/1.121564

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We have improved the optical characteristics of aluminum-coated fiber probes used in near-field scanning optical microscopy by milling with a focused ion beam. This treatment produces a flat-end face free of aluminum grains, containing a well-defined circularly-symmetric aperture with controllable diameter down to 20 nm. The polarization behavior of the tips is circularly symmetric with a polarization ratio exceeding 1:100. The improved imaging characteristics are demonstrated by measuring single molecule fluorescence. Count rates increase more than one order of magnitude over unmodified probes, and the molecule images map a spatial electric field distribution of the aperture in agreement with calculations. ©1998 American Institute of Physics.

 

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