首页   按字顺浏览 期刊浏览 卷期浏览 Optical‐beam‐deflection atomic force microscopy: The NaCl (001) su...
Optical‐beam‐deflection atomic force microscopy: The NaCl (001) surface

 

作者: Gerhard Meyer,   Nabil M. Amer,  

 

期刊: Applied Physics Letters  （AIP Available online 1990）
卷期: Volume 56, issue 21  

页码: 2100-2101

 

ISSN:0003-6951

 

年代: 1990

 

DOI:10.1063/1.102985

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We have imaged, in ultrahigh vacuum, the (001) surface of NaCl using an optical‐beam‐deflectin force microscope operating in the short‐range repulsive regime. The design and performance characteristics of the microscope are given, and the observed atomic corrugations are compared with those deduced from He‐atom scattering experiments.

 

点击下载:  PDF (253KB)



返 回