首页   按字顺浏览 期刊浏览 卷期浏览 Epitaxial Growth of Gallium Phosphide on Cleaved and Polished (111) Calcium Fluoride
Epitaxial Growth of Gallium Phosphide on Cleaved and Polished (111) Calcium Fluoride

 

作者: A. Y. Cho,  

 

期刊: Journal of Applied Physics  (AIP Available online 1970)
卷期: Volume 41, issue 2  

页码: 782-786

 

ISSN:0021-8979

 

年代: 1970

 

DOI:10.1063/1.1658749

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The mechanism of growth of GaP on a cleaved CaF2(111) surface was studiedin situin a high‐energy reflection electron diffraction system. It was found that in the early stages of growth, GaP forms tetrahedral nuclei with {111} faces. The three edges of the tetrahedron are parallel to the three ⟨110⟩ directions. These microcrystals coalesce and form a smooth film after a mean thickness of more than 300 monolayers of GaP is deposited on the surface. Temperatures for epitaxial growth of a single crystal without twinning as a function of the atom arrival rate were studied for GaP on a clean CaF2surface and on a GaP‐covered CaF2surface. It was found that growing GaP without twinning on a bare cleaved CaF2surface requires a temperature ∼65°C higher than on a surface that is covered with GaP. The structural characteristics of the GaP film as a function of the substrate temperature are also discussed.

 

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