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A ``Differential Reflectometer'' for Measurements of Small Differences in Reflectivity

 

作者: J. Alfaro Holbrook,   R. E. Hummel,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1973)
卷期: Volume 44, issue 4  

页码: 463-466

 

ISSN:0034-6748

 

年代: 1973

 

DOI:10.1063/1.1686156

 

出版商: AIP

 

数据来源: AIP

 

摘要:

An instrument is described which measures small differences in optical reflectivity or transmissivity of two specimens. The apparatus has been used to investigate surface effects such as corrosion or deformation of thin surface layers as well as metallurgical transformations or compositional modulation. A complete ``differential spectrogram'', i.e., scan through the visible and near uv region, is performed in less than 1 min.

 

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