A ``Differential Reflectometer'' for Measurements of Small Differences in Reflectivity
作者:
J. Alfaro Holbrook,
R. E. Hummel,
期刊:
Review of Scientific Instruments
(AIP Available online 1973)
卷期:
Volume 44,
issue 4
页码: 463-466
ISSN:0034-6748
年代: 1973
DOI:10.1063/1.1686156
出版商: AIP
数据来源: AIP
摘要:
An instrument is described which measures small differences in optical reflectivity or transmissivity of two specimens. The apparatus has been used to investigate surface effects such as corrosion or deformation of thin surface layers as well as metallurgical transformations or compositional modulation. A complete ``differential spectrogram'', i.e., scan through the visible and near uv region, is performed in less than 1 min.
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