The calculation and the photoluminescence characterization of energy levels in a strainedGaAs/In0.2Ga0.8As/GaAsquantum well heterostructure for the application of light-emitting real-space transfer devices
作者:
Yung-Hui Yeh,
Joseph Ya-min Lee,
期刊:
Journal of Applied Physics
(AIP Available online 1997)
卷期:
Volume 81,
issue 10
页码: 6921-6927
ISSN:0021-8979
年代: 1997
DOI:10.1063/1.365254
出版商: AIP
数据来源: AIP
摘要:
Real-space transfer (RST) light-emitting devices are implemented with a strained GaAs/InGaAs/GaAs quantum well heterostructure fabricated on GaAs substrates. The device energy band diagrams are simulated by using theMEDICIprogram. The effects of critical thickness, quantum size, and strain-induced band-gap shift on the optical transition energies at 77 and 300 K are calculated. Photoluminescence (PL) measurement is carried out to characterize the RST light-emitting devices. The measured results agree well with calculated values. The narrowest full widths at half-maximum of PL spectra are measured to be 17 meV at 300 K and 9 meV at 77 K for an undopedGaAs/In0.2Ga0.8As/GaAsquantum well heterostructure. The PL spectra confirm that the emission is dominated by emission from the strained GaAs/InGaAs/GaAs quantum well. ©1997 American Institute of Physics.
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