Lower bounds for the length of test sequences using UIOs
作者:
Marion Rodrigues,
Hasan Ural,
期刊:
Networks
(WILEY Available online 1995)
卷期:
Volume 25,
issue 1
页码: 31-39
ISSN:0028-3045
年代: 1995
DOI:10.1002/net.3230250105
出版商: Wiley Subscription Services, Inc., A Wiley Company
数据来源: WILEY
摘要:
AbstractThe optimality of the length of a test sequence for a given finite‐state machine can be determined only with respect to the class of test sequences that employ the same number and type of state identification/verification (SIV) sequences and satisfy the same requirements for the starting and terminating states. Given a certain number and type of SIV sequences, we identify three different types of optimality for test sequences: Type11requires test sequences to begin and end at the initial state; Type1yrequires only that test sequences begin at the initial state; and Typexyimposes no requirements whatsoever on the starting and terminating states. Based on these definitions, we investigate the case where Unique Input Output (UIO) sequences are given as SIV sequences and derive lower bounds for the length of test sequences of Type11, Type1y, and Typex
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