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The Design and Use of V-Mask Control Schemes

 

作者: LucasJames M.,  

 

期刊: Journal of Quality Technology  （Taylor Available online 1976）
卷期: Volume 8, issue 1  

页码: 1-12

 

ISSN:0022-4065

 

年代: 1976

 

DOI:10.1080/00224065.1976.11980706

 

出版商: Taylor&Francis

 

关键词: V-Mask;Average Run Length (ARL);Decision Interval (h);Allowable Slack (k);Cumulative Sum (CUSUM)

 

数据来源: Taylor

 

摘要:

V-mask control schemes provide significantly better performance than Shewhart control charts for detecting small shifts of the mean from goal conditions. This paper discusses the design and use of V-mask control schemes. An extensive discussion of a practical application in the chemical industry is given.

 

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