Mapping of2Dcontact perturbations by electrons on a helium film
作者:
E. Teske,
P. Wyder,
P. Leiderer,
V. Shikin,
期刊:
Low Temperature Physics
(AIP Available online 1998)
卷期:
Volume 24,
issue 2
页码: 119-120
ISSN:1063-777X
年代: 1998
DOI:10.1063/1.593553
出版商: AIP
数据来源: AIP
摘要:
A promising way to investigate2Dcontact phenomena is proposed. This method is based on the idea of depositing surface state electrons (SSE) on a thin layer of liquid helium covering the surface of a solid sample containing a2Dcharge carrier system. The density of SSE adjusts to screen contact-induced perturbations of the electrostatic potential across the sample. As a result, the helium layer thickness varies due to the variation of the electrostatic pressure, thus providing a map. This map may be read off interferometrically by a technique already employed for the investigation of multi-electron dimples on helium. We have realized this mapping for a structured electrode as a test sample to demonstrate the resolution of the method. ©1998 American Institute of Physics.
点击下载:
PDF
(47KB)
返 回