Nonlinear analysis of Electrostatic Force Microscopy
作者:
R. Dianoux,
F. Martins,
F. Marchi,
C. Alandi,
F. Comin,
J. Chevrier,
期刊:
AIP Conference Proceedings
(AIP Available online 1903)
卷期:
Volume 696,
issue 1
页码: 955-962
ISSN:0094-243X
年代: 1903
DOI:10.1063/1.1639808
出版商: AIP
数据来源: AIP
摘要:
In a search to control charge injection and detection with an atomic force microscope, dynamic force curves are investigated in the presence of an electrostatic tip‐sample coupling. An analytical study, using a plane capacitor model, provides results in good agreement with experimental data, in particular for the hysteretic behavior of the tip. Moreover, the plane capacitor model furnishes an estimation of the detected charge in our experiment of 360 electrons on aSiO2surface. © 2003 American Institute of Physics
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