Relief‐exposure characteristics of radiographs in relief
作者:
S. Mardix,
M. Keene,
D. A. Swyt,
E. C. Teague,
期刊:
Journal of Applied Physics
(AIP Available online 1978)
卷期:
Volume 49,
issue 2
页码: 498-500
ISSN:0021-8979
年代: 1978
DOI:10.1063/1.324673
出版商: AIP
数据来源: AIP
摘要:
Highly exposed radiographs are utilized in microradiography in order to increase the signal‐to‐noise ratio. Relief radiography enables the evaluation of these microradiographs. Relief‐exposure characteristics are shown to follow a relationship of the typeR=Rm[1−exp(−E/Em)], whereRis the relief height,Eis the exposure, andRmandEmare constants. The density of developed silver in Ilford L‐4 nuclear emulsion is found from the value ofRmto be 2.86. The constantEmis shown to give the exposure for maximum contrast. The experimental results are discussed and compared to those found in the literature.
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