An epoxy replica of a test piece designed to simulte a Wolter x‐ray microscope geometry showed no loss of x‐ray refletivity or resolution, compared to the original. The test piece was a diamond‐turned cone with 1.5° half angle. A flat was fly‐cut on one side, then super‐ and conventionally polished. The replica was separated at the 1.5°‐draft angle, simulating a shallow angle Wolter microscope geometry. A test with 8.34 A˚ x rys at 0.9° grazing angle showed a reflectivity of 67% for the replica flat surface, and 70% for the original. No spread of the refleted beam was observed with a 20‐arc second wide test beam. This test verifies the epoxy replication technique for production of Wolter x‐ray microscopes.