Atomic force microscopy (AFM), in various versions, has had major impact as a surface structural and spectroscopic tool since its invention in 1986. At its present state of development, however, the interpretation of AFM images is limited by the current state of methodologies for calibration over the wide dynamic range of magnification. Also, the parameters of individual tips, as well as the generic characteristics of different kinds of tips, affect both the quality of the images and their interpretation. Finally, the very nature of the tip‐to‐surface interaction will generate artefacts, in addition to those associated with tip shape, which need to be fully understood by the practitioners of force microscopy. This project seeks to address and shed light on some of these issues.Polystyrene beads deposited on mica substrates form hexagonal close‐packed layers. The unit cell parameters are suitable for calibration of the AFM in the lateral plane, while the perpendicular spacing of the layers is appropriate for calibration along the vertical axis. Using different size fractions, it is straightforward to determine the extents of linearity, orthogonality, thermal and instrumental drifts over distances from 100 nm to tens of micrometres. The present results show that the methodologies for contact mode operation can be adapted to noncontact modes.It is known that an AFM image arises from a convolution of surface topography and tip shape, and is mediated by the interaction. In principle it is possible to carry out a deconvolution, if we have complete knowledge about two of the three elements (i.e. tip, surface and interaction). In practice we rarely have the requisite information. Prominent artefacts will occur when the characteristic parameters of the tip are comparable to those of the surface topography, and/or if there is a variable strength, or extent of localization, of the interaction. The present results demonstrate artefacts due to effects of geometry as well as inte