The reliability of potted components
作者:
K.A.Fletcher,
期刊:
Proceedings of the IEE - Part B: Electronic and Communication Engineering
(IET Available online 1962)
卷期:
Volume 109,
issue 21S
页码: 271-280
年代: 1962
DOI:10.1049/pi-b-2.1962.0049
出版商: IEE
数据来源: IET
摘要:
The paper reviews the development of epoxide-resin casting systems for the potting of electronic components and gives the results of some long-term investigations of the effect of various resin formulations on component values.The first part of the paper deals with the chemical aspects of the reliability of resin-cast components, together with an assessment of the results of some long-term chemical immersion tests. The second part covers the drift of component values during temperature cycling and storage, with particular reference to grade I high-stability resistors.
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