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Electric contacts. I. Application of interference fringe microscopy to electric contact problems

 

作者: R. E. Cuthrell,   D. W. Tipping,  

 

期刊: Journal of Applied Physics  （AIP Available online 1973）
卷期: Volume 44, issue 7  

页码: 3277-3283

 

ISSN:0021-8979

 

年代: 1973

 

DOI:10.1063/1.1662747

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The utility of laser interference fringe microscopy is demonstrated in a variety of electric contact problems. The technique is used for quantitative surface topography, measurement of load‐bearing areas, lubricant film characterization, wetting angle measurements, and particulate contaminant size determinations.

 

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