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Fault simulation and test generation—an overview

 

作者: JohnStressing,  

 

期刊: Computer-Aided Engineering Journal  (IET Available online 1989)
卷期: Volume 6, issue 3  

页码: 92-98

 

年代: 1989

 

DOI:10.1049/cae.1989.0022

 

出版商: IEE

 

数据来源: IET

 

摘要:

A design or test engineer may proudly boast ‘I have a fault coverage of 96%’. What does he or she mean by that and how does it relate to yield in production or detection of system failures? The paper explains some basic concepts with regard to fault simulation and indicates the relationship between fault coverage and yield.

 

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