Fault simulation and test generation—an overview
作者:
JohnStressing,
期刊:
Computer-Aided Engineering Journal
(IET Available online 1989)
卷期:
Volume 6,
issue 3
页码: 92-98
年代: 1989
DOI:10.1049/cae.1989.0022
出版商: IEE
数据来源: IET
摘要:
A design or test engineer may proudly boast ‘I have a fault coverage of 96%’. What does he or she mean by that and how does it relate to yield in production or detection of system failures? The paper explains some basic concepts with regard to fault simulation and indicates the relationship between fault coverage and yield.
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