首页   按字顺浏览 期刊浏览 卷期浏览 Energy analysis of microwave ion sources
Energy analysis of microwave ion sources

 

作者: K. Tokiguchi,   N. Sakudo,   H. Koike,  

 

期刊: Journal of Vacuum Science&Technology A: Vacuum, Surfaces, and Films  (AIP Available online 1984)
卷期: Volume 2, issue 1  

页码: 29-34

 

ISSN:0734-2101

 

年代: 1984

 

DOI:10.1116/1.572620

 

出版商: American Vacuum Society

 

关键词: argon ions;energy spectra;beam analyzers;beam monitors;microwave equipment;ion sources;plasma;beam production;ion beams;beam optics;electric currents;mass spectroscopy

 

数据来源: AIP

 

摘要:

Energy spreads of Ar+beams extracted from a microwave ion source are investigated using a high resolution, cylindrical‐sector energy analyzer. The energy spread, measured from the spectrum width at half value of the peak, is about 5 eV, and is almost independent of microwave power, gas pressure, and extraction voltage. The excess energy of Ar+beam due to plasma floating potential is from about 10 to 20 eV, depending on gas pressure and microwave power. Comparison with other sources showed the microwave ion source to be suitable for obtaining high current beams of narrow energy spread.

 

点击下载:  PDF (374KB)



返 回