Energy analysis of microwave ion sources
作者:
K. Tokiguchi,
N. Sakudo,
H. Koike,
期刊:
Journal of Vacuum Science&Technology A: Vacuum, Surfaces, and Films
(AIP Available online 1984)
卷期:
Volume 2,
issue 1
页码: 29-34
ISSN:0734-2101
年代: 1984
DOI:10.1116/1.572620
出版商: American Vacuum Society
关键词: argon ions;energy spectra;beam analyzers;beam monitors;microwave equipment;ion sources;plasma;beam production;ion beams;beam optics;electric currents;mass spectroscopy
数据来源: AIP
摘要:
Energy spreads of Ar+beams extracted from a microwave ion source are investigated using a high resolution, cylindrical‐sector energy analyzer. The energy spread, measured from the spectrum width at half value of the peak, is about 5 eV, and is almost independent of microwave power, gas pressure, and extraction voltage. The excess energy of Ar+beam due to plasma floating potential is from about 10 to 20 eV, depending on gas pressure and microwave power. Comparison with other sources showed the microwave ion source to be suitable for obtaining high current beams of narrow energy spread.
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