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Oblique, off‐specular, linear, and nonlinear observations with a scanning micron...
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Oblique, off‐specular, linear, and nonlinear observations with a scanning micron wavelength acoustic microscope
作者:
M. R. T. Tan,
H. L. Ransom,
C. C. Cutler,
M. Chodorow,
期刊:
Journal of Applied Physics
(AIP Available online 1985)
卷期:
Volume 57,
issue 11
页码: 4931-4935
ISSN:0021-8979
年代: 1985
DOI:10.1063/1.335317
出版商: AIP
数据来源: AIP
摘要:
We have constructed a micron wavelength acoustic microscope having a novel geometry which accentuates detail in acoustic imaging while providing ease in focusing, enhanced resolution, and the observation of third‐order nonlinear products (2F1‐F2). Convergent, acoustic beams generated by curved transducers provide very high power densities at the acoustic lens and focus. Oblique acoustic illumination of surfaces gives directionality to the image and the use of a second transducer position, removed from the specularly reflected beams, reduces undesired nonlinear interaction in the intervening liquid (water) medium. Increased resolution and sharper images are obtained by observing the second harmonic via the difference frequency (third‐order product 2F1‐F2) which falls back into the initial frequency range, ∼600 MHz. However, significant effects due to nonlinear interaction identified with the object have not yet been observed.
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