Theory for Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions
作者:
Wayne Nelson,
ThomasJ. Kielpinski,
期刊:
Technometrics
(Taylor Available online 1976)
卷期:
Volume 18,
issue 1
页码: 105-114
ISSN:0040-1706
年代: 1976
DOI:10.1080/00401706.1976.10489407
出版商: Taylor & Francis Group
关键词: Optimum Plans;Accelerated Testing;Censored Life Data;Overst ress Testing;Normal and Lognormal Distribrltions;Reliability;Maximum Likelihood Estimation
数据来源: Taylor
摘要:
This expository paper presents theory for optimum plans for accelerated life tests for estimating a simple linear relationship between a stress and product life, which has a normal or lognormal distribution, when the data are to be analyzed before all test units fail. Standard plans with equal numbers of test units at equally spaced test stresses are presented and are compared with the optimum plans. While the optimllm plans may not always be robust enough in practice, they indicate that more test units should be run at low stress than at high stress. The plans are illustrated with a temperatllre-accelersted life test of an electrical insulation analyzed with the Arrhenius model.
点击下载:
PDF (1179KB)
返 回