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Characterization of photoluminescence intensity and efficiency of free excitons in semiconductor quantum well structures

 

作者: Shirong Jin,   Yanlan Zheng,   Aizhen Li,  

 

期刊: Journal of Applied Physics  (AIP Available online 1997)
卷期: Volume 82, issue 8  

页码: 3870-3873

 

ISSN:0021-8979

 

年代: 1997

 

DOI:10.1063/1.365689

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The photoluminescence (PL) intensity of free excitons in a GaInAsSb/GaAlAsSb single quantum well structure is investigated as a function of excitation intensity and lattice temperature. The relationship between PL intensity of free excitons and excitation intensity as well as lattice temperature was developed for the quantitative descriptions of the experimental data. ©1997 American Institute of Physics.

 

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