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Instrument for research on interfaces and surfaces

 

作者: C. Bonnelle,   F. Vergand,   P. Jonnard,   J.‐M. Andre´,   P. F. Staub,   P. Avila,   P. Chargele`gue,   M.‐F. Fontaine,   D. Laporte,   P. Paquier,   A. Ringuenet,   B. Rodriguez,  

 

期刊: Review of Scientific Instruments  （AIP Available online 1994）
卷期: Volume 65, issue 11  

页码: 3466-3471

 

ISSN:0034-6748

 

年代: 1994

 

DOI:10.1063/1.1144524

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We describe an instrument designed for studying the electronic structure of bulk, surface, and deep solid–solid interface. The analysis is made by soft‐x‐ray emission spectroscopy induced by electron bombardment. The target is placed under ultrahigh vacuum and can be prepared and treatedinsitu. High resolution is achieved both as concerns the photon energy and the electron‐beam energy. Tests have been made in the dispersive mode and in the characteristic isochromat mode. In both cases experimental resolution is in good agreement with the expected one.

 

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