Back bias depending polarization sensitivity of PtSi/p‐Si Schottky barrier detectors
作者:
K. Kapser,
P. P. Deimel,
期刊:
Applied Physics Letters
(AIP Available online 1995)
卷期:
Volume 66,
issue 26
页码: 3615-3617
ISSN:0003-6951
年代: 1995
DOI:10.1063/1.113805
出版商: AIP
数据来源: AIP
摘要:
The optical response of PtSi/p‐Si Schottky barrier detectors structured with a lamellar grating was investigated. The quantum efficiencyYfor TE and TM polarized light for different samples with grating constants &Lgr;=3 &mgr;m, 4 &mgr;m, 5 &mgr;m, and with a grating amplitudeh=1100 nm was measured. The ratioYTM/YTEstrongly depends on the back bias of the diode. Theoretical calculations are presented which explain the results taking into account the locally varying Schottky barrier height and optical absorption induced by the grating. ©1995 American Institute of Physics.
点击下载:
PDF
(88KB)
返 回