On the image contrast from dislocations in high-angle annular dark-field scanning transmission electron microscopy
作者:
D.D. Perovic,
A. Howie,
C.J. Rossouw,
期刊:
Philosophical Magazine Letters
(Taylor Available online 1993)
卷期:
Volume 67,
issue 4
页码: 261-272
ISSN:0950-0839
年代: 1993
DOI:10.1080/09500839308240938
出版商: Taylor & Francis Group
数据来源: Taylor
摘要:
High-angle annular dark-field scanning-transmission electron microscopic imaging of inclined dislocation segments revealed a number of characteristic contrast effects that have been shown to depend on the specific position of the dislocation in the foil. The dislocation contrast is initially very dark at the entrant foil surface due to stress relaxation-induced scattering of the incident electrons. Below the entrant surface of the foil, the dislocation exhibits oscillatory contrast which disappears for large incident beam divergence angles. Ultimately, the dislocation contrast remains bright beyond a certain depth in the crystal towards the exit foil surface. A qualitative Bloch-wave scattering description has been formulated to describe consistently the observed contrast features.
点击下载:
PDF (865KB)
返 回