Open‐circuit dark‐surface potential measurements on corona‐charged solution cast films of polyvinylidene fluoride and a copolymer of vinylidene fluoride and trifluoroethylene show a slower decay after these films have been mechanically peeled from their silicon substrates. It is proposed that peeling produces a thin region of high trap density in the interface layer close to the peeled surface. A simple model of surface voltage decay is presented which accounts for near‐surface trapping due to peeling as well as bulk trapping. Practical ranges for the interface layer thickness and trapping density are discussed.