Fabrication and performance characteristics of buried-facet optical amplifiers
作者:
N. K. Dutta,
A. B. Piccirilli,
M. S. Lin,
R. L. Brown,
J. Wynn,
D. Coblentz,
Y. Twu,
U. K. Chakrabarti,
期刊:
Journal of Applied Physics
(AIP Available online 1990)
卷期:
Volume 67,
issue 9
页码: 3943-3947
ISSN:0021-8979
年代: 1990
DOI:10.1063/1.345003
出版商: AIP
数据来源: AIP
摘要:
The fabrication, performance characteristics, and design rules of buried-facet optical amplifiers are described. Chip gain of 25 dB, gain ripple of <1 dB, and gain difference of ≤1 dB for TE- and TM-polarized light are observed. The gain ripple and polarization dependence of gain correlate well with the ripple and polarization dependence of the amplified spontaneous emission spectrum. The performance of buried-facet amplifiers is comparable to that of cleaved-facet amplifiers with very good antireflection (R<10−4) coatings. The buried-facet design reduces the requirement on antireflection coatings and makes the fabrication process more reproducible.
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