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Concepts in competitive microelectronics manufacturing

 

作者: Michael Liehr,   Gary W. Rubloff,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  (AIP Available online 1994)
卷期: Volume 12, issue 4  

页码: 2727-2740

 

ISSN:1071-1023

 

年代: 1994

 

DOI:10.1116/1.587239

 

出版商: American Vacuum Society

 

关键词: MICROELECTRONICS;MANUFACTURING;COMPETITION;PROCESSING;REAL TIME SYSTEMS;MARKETING;COST ESTIMATION;QUALITY CONTROL;PERFORMANCE TESTING

 

数据来源: AIP

 

摘要:

While progress in the microelectronics industry is gated by the frontiers of high technology and its underlying science, competitiveness in this industry is determined at least as much by how effectively the relevant science and engineering are integrated to address those issues central to manufacturing. Competitive manufacturing places a premium on such factors as rapid learning in technology development and yield enhancement, process and factory control, minimization of capital costs, and equipment and product reliability, all factors which synthesize the individual science and engineering elements associated with microelectronics technology. This paper is a primer for research aimed at impacting microelectronics manufacturing science and technology. After presenting an overview of competitiveness requirements for manufacturing, it focuses on strategic elements: advanced process equipment, process/materials characterization and real time process control, defect identification/control and reliability, three‐dimensional processing and manufacturability, and process integration.

 

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