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Sensitivity of Bayesian sampling inspection schemes to a non-normal prior distribution

 

作者: Ashok K. Bansal,   Pankaj Sinha,  

 

期刊: Journal of Applied Statistics  (Taylor Available online 1992)
卷期: Volume 19, issue 1  

页码: 103-109

 

ISSN:0266-4763

 

年代: 1992

 

DOI:10.1080/02664769200000008

 

出版商: Carfax Publishing Company

 

数据来源: Taylor

 

摘要:

summary In this paper we derive the predictive density function of a future observation under the assumption of Edgeworth-type non-normal prior distribution for the unknown mean of a normal population. Fixed size single sample and sequential sampling inspection plans, in a decisive prediction framework, are examined for their sensitivity to departures from normality of the prior distribution. Numerical illustrations indicate that the decision to market the remaining items of a given lot for a fixed size plan may be sensitive to the presence of skewness or kurtosis in the prior distribution. However, Bayes'decision based on the sequential plan may not change though expected gains may change with variation in the non-normality of the prior distribution.

 

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