Sensitivity of Bayesian sampling inspection schemes to a non-normal prior distribution
作者:
Ashok K. Bansal,
Pankaj Sinha,
期刊:
Journal of Applied Statistics
(Taylor Available online 1992)
卷期:
Volume 19,
issue 1
页码: 103-109
ISSN:0266-4763
年代: 1992
DOI:10.1080/02664769200000008
出版商: Carfax Publishing Company
数据来源: Taylor
摘要:
summary In this paper we derive the predictive density function of a future observation under the assumption of Edgeworth-type non-normal prior distribution for the unknown mean of a normal population. Fixed size single sample and sequential sampling inspection plans, in a decisive prediction framework, are examined for their sensitivity to departures from normality of the prior distribution. Numerical illustrations indicate that the decision to market the remaining items of a given lot for a fixed size plan may be sensitive to the presence of skewness or kurtosis in the prior distribution. However, Bayes'decision based on the sequential plan may not change though expected gains may change with variation in the non-normality of the prior distribution.
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