L&agr; x‐ray production efficiency fromZ=50–82 thick target elements by electron impacts from threshold energy to 30 keV
作者:
K. Shima,
M. Okuda,
E. Suzuki,
T. Tsubota,
T. Mikumo,
期刊:
Journal of Applied Physics
(AIP Available online 1983)
卷期:
Volume 54,
issue 3
页码: 1202-1208
ISSN:0021-8979
年代: 1983
DOI:10.1063/1.332200
出版商: AIP
数据来源: AIP
摘要:
Thick target yields ofL&agr; x rays (x rays/str electron) under electron bombardments from around threshold energy to 30 keV are presented for pure elements of Sn, Sm, Ta, W, Pt, Au, and Pb. The calculation ofKx‐ray yields by Green and Cosslett has been applied to the deduction ofL&agr; x‐ray yields and observed data have been compared with the calculation. A good agreement has been obtained for highZelements. An empirical formula for observedL&agr; x‐ray yieldsIL&agr;(x rays/str electron) has been found to be expressed byIL&agr;=1.3×10−7×Z1.3(UL3−1)1.46×0.938[ln(UL3−1)]2in impact energies less than 30 keV, whereUL3is the overvoltage ratio defined by the ratio of electron impact energy toL3shell ionization energy.
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