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Room-temperature photoluminescence and electroluminescence from Er-doped silicon-rich silicon oxide

 

作者: L. Tsybeskov,   S. P. Duttagupta,   K. D. Hirschman,   P. M. Fauchet,   K. L. Moore,   D. G. Hall,  

 

期刊: Applied Physics Letters  (AIP Available online 1997)
卷期: Volume 70, issue 14  

页码: 1790-1792

 

ISSN:0003-6951

 

年代: 1997

 

DOI:10.1063/1.118693

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Porous silicon was doped by Er ions using electroplating and was converted to silicon-rich silicon oxide (SRSO) by partial thermal oxidation at 900 °C. The room-temperature photoluminescence (PL) at ∼1.5 &mgr;m is intense and narrow (⩽15 meV) and decreases by less than 50&percent; from 12 to 300 K. The PL spectrum reveals no luminescence bands related to Si-bandedge recombination, point defects, or dislocations and shows that theEr3+centers are the most efficient radiative recombination centers. A light-emitting diode (LED) with an active layer made of Er-doped SRSO (SRSO:Er) was manufactured and room temperature electroluminescence at ∼1.5 &mgr;m was demonstrated. ©1997 American Institute of Physics.

 

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