Room-temperature photoluminescence and electroluminescence from Er-doped silicon-rich silicon oxide
作者:
L. Tsybeskov,
S. P. Duttagupta,
K. D. Hirschman,
P. M. Fauchet,
K. L. Moore,
D. G. Hall,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 70,
issue 14
页码: 1790-1792
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.118693
出版商: AIP
数据来源: AIP
摘要:
Porous silicon was doped by Er ions using electroplating and was converted to silicon-rich silicon oxide (SRSO) by partial thermal oxidation at 900 °C. The room-temperature photoluminescence (PL) at ∼1.5 &mgr;m is intense and narrow (⩽15 meV) and decreases by less than 50&percent; from 12 to 300 K. The PL spectrum reveals no luminescence bands related to Si-bandedge recombination, point defects, or dislocations and shows that theEr3+centers are the most efficient radiative recombination centers. A light-emitting diode (LED) with an active layer made of Er-doped SRSO (SRSO:Er) was manufactured and room temperature electroluminescence at ∼1.5 &mgr;m was demonstrated. ©1997 American Institute of Physics.
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