首页   按字顺浏览 期刊浏览 卷期浏览 Current characteristics in near field emission scanning tunneling microscopes
Current characteristics in near field emission scanning tunneling microscopes

 

作者: G. Mesa,   J. J. Sáenz,   R. García,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  （AIP Available online 1996）
卷期: Volume 14, issue 4  

页码: 2403-2406

 

ISSN:1071-1023

 

年代: 1996

 

DOI:10.1116/1.588869

 

出版商: American Vacuum Society

 

关键词: FIELD EMISSION;WORK FUNCTIONS;ELECTRIC FIELDS;INSTABILITY

 

数据来源: AIP

 

摘要:

The operation of the scanning tunneling microscope (STM) in the near field emission regime provides a direct, noninvasive approach for investigating surfaces at nanometer scale. Here, we present a study of the current characteristics in a near field emission STM. The influence of tip’s geometry is analyzed. We show that the electron field emission from the sample is stable against tip‐shape changes due to adsorbate diffusion or atomic rearrangements.

 

点击下载:  PDF (97KB)



返 回