Highly‐reliable temperature sensor using rf‐sputtered SiC thin film
作者:
Kiyotaka Wasa,
Takao Tohda,
Yukio Kasahara,
Shigeru Hayakawa,
期刊:
Review of Scientific Instruments
(AIP Available online 1979)
卷期:
Volume 50,
issue 9
页码: 1084-1088
ISSN:0034-6748
年代: 1979
DOI:10.1063/1.1135988
出版商: AIP
数据来源: AIP
摘要:
A SiC thin‐film thermistor for high‐temperature use has been developed by using rf‐sputtered SiC thin films. This thermistor can be used for industrial and consumer use within an operating temperature range of −100 to 450 °C. By using SiC thin films, the thermistor maintains high electrical stability. The resistance change is less than 3% after exposure to heat at 400 °C for 2000 h. In addition, the film growth technique made possible the production of a high‐accuracy thermistor, i.e., thermistor coefficient <±0.5%, thermistor resistance <±1.5%.
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