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Growth and characterization of phosphorous doped {111} homoepitaxial diamond thin films

 

作者: S. Koizumi,   M. Kamo,   Y. Sato,   H. Ozaki,   T. Inuzuka,  

 

期刊: Applied Physics Letters  (AIP Available online 1997)
卷期: Volume 71, issue 8  

页码: 1065-1067

 

ISSN:0003-6951

 

年代: 1997

 

DOI:10.1063/1.119729

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Ann-type semiconducting diamond thin film was obtained by microwave enhanced plasma chemical vapor deposition using phosphine(PH3)as a dopant source. A homoepitaxial diamond thin film with a thickness of about 300 nm was grown on the {111} surface of a type Ib diamond with a variety of dopant concentrations. Over a wide range of dopant concentrations (PH3/CH4:1000–20 000 ppm), then-type conduction was confirmed by Hall-effect measurements. The activation energy of carriers was 0.43 eV. The Hall mobility of about23 cm2/V shas been obtained at around 500 K for the 1000 ppm sample. No significant increase of hydrogen has been observed by secondary-ion-mass-spectroscopy analysis for the phosphorous doped layers. ©1997 American Institute of Physics.

 

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