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Atomically resolved images of bismuth films on mica with an atomic force microscope

 

作者: A. L. Weisenhorn,   P. N. Henriksen,   H. T. Chu,   R. D. Ramsier,   D. H. Reneker,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  (AIP Available online 1991)
卷期: Volume 9, issue 2  

页码: 1333-1335

 

ISSN:1071-1023

 

年代: 1991

 

DOI:10.1116/1.585190

 

出版商: American Vacuum Society

 

关键词: ATOMIC FORCE MICROSCOPY;FILM GROWTH;BISMUTH;THIN FILMS;CRYSTAL STRUCTURE;OXIDATION;EPITAXY;ADSORPTION

 

数据来源: AIP

 

摘要:

Bi(111) films grown on mica substrates and then exposed to air have been imaged with an atomic force miroscope in 0.01 M HCl. By exposing the Bi(111) to air, layers of Bi oxide are readily formed, which can be removed by imaging in HCl. The images are atomically resolved and show two types of structure: large epitaxial areas of hexagonal structure with a spacing of 7.6 Å, and a few smaller regions with a spacing of 4.5 Å. The former agrees well with the (√3×√3)R30° structure of an overlayer of atomic oxygen atoms adsorbed on Bi(111), and the latter with the uncovered Bi(111) surface.

 

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