首页   按字顺浏览 期刊浏览 卷期浏览 Low temperature scanning-tip microwave near-field microscopy ofYBa2Cu3O7−xfilms
Low temperature scanning-tip microwave near-field microscopy ofYBa2Cu3O7−xfilms

 

作者: I. Takeuchi,   T. Wei,   Fred Duewer,   Y. K. Yoo,   X.-D. Xiang,   V. Talyansky,   S. P. Pai,   G. J. Chen,   T. Venkatesan,  

 

期刊: Applied Physics Letters  (AIP Available online 1997)
卷期: Volume 71, issue 14  

页码: 2026-2028

 

ISSN:0003-6951

 

年代: 1997

 

DOI:10.1063/1.119776

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We have explored the low temperature capability of a scanning-tip microwave near-field microscope to study superconductors. The shift in the quality factor of the microscope resonator can be used to obtain the temperature dependence of the surface resistance of a local region under the tip. PatternedYBa2Cu3O7−xfilms were scanned at various temperatures and surface resistance mapping was performed with high spatial resolution at 1.2 GHz. Superconducting transitions at different positions on a film can be detected. Edge-region defects in wet-etched patterns were observed and were shown to be nonsuperconducting at microwave frequencies at 80 K. ©1997 American Institute of Physics.

 

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