Low temperature scanning-tip microwave near-field microscopy ofYBa2Cu3O7−xfilms
作者:
I. Takeuchi,
T. Wei,
Fred Duewer,
Y. K. Yoo,
X.-D. Xiang,
V. Talyansky,
S. P. Pai,
G. J. Chen,
T. Venkatesan,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 71,
issue 14
页码: 2026-2028
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.119776
出版商: AIP
数据来源: AIP
摘要:
We have explored the low temperature capability of a scanning-tip microwave near-field microscope to study superconductors. The shift in the quality factor of the microscope resonator can be used to obtain the temperature dependence of the surface resistance of a local region under the tip. PatternedYBa2Cu3O7−xfilms were scanned at various temperatures and surface resistance mapping was performed with high spatial resolution at 1.2 GHz. Superconducting transitions at different positions on a film can be detected. Edge-region defects in wet-etched patterns were observed and were shown to be nonsuperconducting at microwave frequencies at 80 K. ©1997 American Institute of Physics.
点击下载:
PDF
(167KB)
返 回