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Femtosecond hole thermalization in bulk GaAs

 

作者: R. Tommasi,   P. Langot,   F. Valle´e,  

 

期刊: Applied Physics Letters  (AIP Available online 1995)
卷期: Volume 66, issue 11  

页码: 1361-1363

 

ISSN:0003-6951

 

年代: 1995

 

DOI:10.1063/1.113201

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Ultrafast hole relaxation dynamics is selectively investigated in intrinsic bulk GaAs using a high sensitivity two‐wavelength pump‐probe technique. Nonequilibrium carriers are photoexcited close to the bottom of their respective bands and hole heating is followed by monitoring the transient bleaching of optical transitions involving higher momentum states. Hole heating is found to be dominated by hole‐phonon interactions with a thermalization time of the order of 150 fs for carriers densities in the 1017cm−3range. ©1995 American Institute of Physics.

 

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