Atomic imaging of an InSe single‐crystal surface with atomic force microscope
作者:
Kohei Uosaki,
Michio Koinuma,
期刊:
Journal of Applied Physics
(AIP Available online 1993)
卷期:
Volume 74,
issue 3
页码: 1675-1678
ISSN:0021-8979
年代: 1993
DOI:10.1063/1.354820
出版商: AIP
数据来源: AIP
摘要:
The atomic force microscope was employed to observed in air the surface atomic structure of InSe, one of III‐VI compound semiconductors with layered structures. Atomic arrangements were observed in bothn‐type andp‐type materials. The observed structures are in good agreement with those expected from bulk crystal structures. The atomic images became less clear by repeating the imaging process. Wide area imaging after the imaging of small area clearly showed that a mound was created at the spot previously imaged.
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