首页   按字顺浏览 期刊浏览 卷期浏览 Surface reactivity and interface morphology for Ti growth on YBa2Cu3O7−x, Y2BaCuO...
Surface reactivity and interface morphology for Ti growth on YBa2Cu3O7−x, Y2BaCuO5, and CuO

 

作者: H. M. Meyer,   J. H. Weaver,   K. C. Goretta,  

 

期刊: Journal of Applied Physics  (AIP Available online 1990)
卷期: Volume 67, issue 4  

页码: 1995-2002

 

ISSN:0021-8979

 

年代: 1990

 

DOI:10.1063/1.345580

 

出版商: AIP

 

数据来源: AIP

 

摘要:

X‐ray photoemission results make it possible to compare Ti adatom reactivity with clean surfaces of CuO, Y2BaCuO5, and YBa2Cu3O7−x. Changes in the Ti 2p1/2,3/2and O 1score level emission during overlayer growth are related to surface reactions between the Ti adatoms and oxygen atoms leached from the substrates. The results show the growth of a TiO2‐like reaction species at initial Ti depositions, the formation of Ti suboxides at intermediate coverages, and the onset of metallic behavior at higher Ti coverages. The Ti‐O reaction products grow in a layer‐by‐layer fashion initially, but Ti metal overlayer growth occurs as clusters on this Ti‐O reacted region. Substrate modifications associated with Ti‐O reactions result in significant changes in the chemical environments of Cu, Ba, and Y for Y2BaCuO5and YBa2Cu3O7−x.

 

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