Aluminum nitride on silicon surface acoustic wave devices
作者:
L. G. Pearce,
R. L. Gunshor,
R. F. Pierret,
期刊:
Applied Physics Letters
(AIP Available online 1981)
卷期:
Volume 39,
issue 11
页码: 878-879
ISSN:0003-6951
年代: 1981
DOI:10.1063/1.92591
出版商: AIP
数据来源: AIP
摘要:
Reactive rf planar magnetron sputtering has been used at substrate temperatures below 300 °C to deposit highly oriented piezoelectric AlN films on silicon for surface acoustic wave device applications. The substrates were (100)‐oriented,n‐type silicon with and without a thermally grown oxide. Several new AlM‐on‐silicon surface acoustic wave devices were fabricated and tested. The devices reported herein include two‐port delay lines, degenerate monolithic convolvers, and two‐port surface acoustic wave resonators utilizing metal strip reflector arrays.
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