Effect of the critical current criteria on theIcvsTrelation nearTcin polycrystalline Y‐Ba‐Cu‐O thin films
作者:
Sang Young Lee,
Y. H. Kim,
J. H. Park,
S. S. Choi,
期刊:
Applied Physics Letters
(AIP Available online 1990)
卷期:
Volume 56,
issue 4
页码: 403-405
ISSN:0003-6951
年代: 1990
DOI:10.1063/1.103294
出版商: AIP
数据来源: AIP
摘要:
We report on the temperature dependence of the critical current (Ic) nearTcfor two Y‐Ba‐Cu‐O thin films having zero‐dissipation temperature (Tc) of 81 K and a Y‐Ba‐Cu‐O thin film havingTcof 71 K. At temperatures higher than 0.9Tc, the critical current in a voltage criterion of 1 &mgr;V/cm appears proportional to (1−T/Tc)nwithn≊2, andn≊1.5 in a 10 &mgr;V/cm criterion, exhibiting the dependence ofnon the critical current criteria. This observation is in contrast with the report ofn=1.5 by Ogaleetal. [Phys. Rev. B36, 7210 (1987)], Yuanetal. [J. Appl. Phys.64, 4091 (1988)], and Horngetal. [Phys. Rev. B39, 9628 (1989)], implying thatn=2, the value for the superconductor‐normal metal‐superconductor tunneling junction of BCS superconductors nearTcmust be taken into consideration to understand the intergrain tunneling process in polycrystalline highTcthin films.
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