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Effect of the critical current criteria on theIcvsTrelation nearTcin polycrystalline Y‐Ba‐Cu‐O thin films

 

作者: Sang Young Lee,   Y. H. Kim,   J. H. Park,   S. S. Choi,  

 

期刊: Applied Physics Letters  (AIP Available online 1990)
卷期: Volume 56, issue 4  

页码: 403-405

 

ISSN:0003-6951

 

年代: 1990

 

DOI:10.1063/1.103294

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We report on the temperature dependence of the critical current (Ic) nearTcfor two Y‐Ba‐Cu‐O thin films having zero‐dissipation temperature (Tc) of 81 K and a Y‐Ba‐Cu‐O thin film havingTcof 71 K. At temperatures higher than 0.9Tc, the critical current in a voltage criterion of 1 &mgr;V/cm appears proportional to (1−T/Tc)nwithn≊2, andn≊1.5 in a 10 &mgr;V/cm criterion, exhibiting the dependence ofnon the critical current criteria. This observation is in contrast with the report ofn=1.5 by Ogaleetal. [Phys. Rev. B36, 7210 (1987)], Yuanetal. [J. Appl. Phys.64, 4091 (1988)], and Horngetal. [Phys. Rev. B39, 9628 (1989)], implying thatn=2, the value for the superconductor‐normal metal‐superconductor tunneling junction of BCS superconductors nearTcmust be taken into consideration to understand the intergrain tunneling process in polycrystalline highTcthin films.

 

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