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Comment on ’’A unified explanation for secondary‐ion yields and ’’mechanism of the SIMS matrix effect’’

 

作者: K. Wittmaack,  

 

期刊: Journal of Applied Physics  (AIP Available online 1981)
卷期: Volume 52, issue 1  

页码: 527-529

 

ISSN:0021-8979

 

年代: 1981

 

DOI:10.1063/1.328451

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Experimental data on secondary‐ions yields recently reported by Delineetal. are analyzed critically. It is shown that whereas the results for oxygen bombardment support earlier findings concerning positive‐secondary‐ion emission, the negative‐ion yields observed under cesium impact reveal previously unknown features. A unified explanation for secondary‐ion yields cannot be deduced from the published results. Simple (exponential) laws may be found only under certain experimental conditions or after averaging procedures.

 

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