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Contribution of Thermal Diffuse Scattering to Integrated Bragg Reflections from Perfect Crystals

 

作者: David R. Chipman,   Boris W. Batterman,  

 

期刊: Journal of Applied Physics  (AIP Available online 1963)
卷期: Volume 34, issue 4  

页码: 912-913

 

ISSN:0021-8979

 

年代: 1963

 

DOI:10.1063/1.1729559

 

出版商: AIP

 

数据来源: AIP

 

摘要:

It is shown that the contribution of thermal diffuse scattering to integrated Bragg intensities from perfect crystals can be much greater than previously expected. Measurements on the (555) reflection of silicon are presented showing a thermal scattering contribution of about 70% of the true Bragg intensity. The special aspect of the effect in perfect crystals is discussed and methods of reducing it or correcting for it are included.

 

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