Dielectric properties of Ta2O5–SiO2polycrystalline ceramics
作者:
R. J. Cava,
J. J. Krajewski,
W. F. Peck,
G. L. Roberts,
期刊:
Journal of Applied Physics
(AIP Available online 1996)
卷期:
Volume 80,
issue 4
页码: 2346-2348
ISSN:0021-8979
年代: 1996
DOI:10.1063/1.363068
出版商: AIP
数据来源: AIP
摘要:
The dielectric properties of (Ta2O5)1−x(SiO2)xpolycrystalline ceramics for 0.0≤x≤0.20 are reported. Measurements were made at 1 MHz and temperature between −40 and +100 °C. The dielectric properties are not very sensitive to SiO2content. A moderate enhancement of the dielectric constant is found, from −30 for pure Ta2O5to ∼45 atx&bartil;0.10. The temperature coefficient of dielectric constant in the vicinity of room temperature decreases from ∼200 ppm/°C for Ta2O5to ∼75 ppm/°C forx=0.14. ©1996 American Institute of Physics.
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