In situetching and regrowth process for edge‐ and surface‐emitting laser diodes with an AlGaAs/GaAs buried heterostructure
作者:
Mutsuo Ogura,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
(AIP Available online 1995)
卷期:
Volume 13,
issue 4
页码: 1529-1535
ISSN:1071-1023
年代: 1995
DOI:10.1116/1.588182
出版商: American Vacuum Society
关键词: LASER DIODES;BURIED HETEROSTRUCTURES;ALUMINIUM ARSENIDES;GALLIUM ARSENIDES;CVD;ETCHING;PHOTOLUMINESCENCE;LIFETIME;(Al,Ga)As;GaAs
数据来源: AIP
摘要:
Aninsitudry etching and metalorganic chemical‐vapor deposition regrowth process is developed to realize AlGaAs/GaAs buried heterostructure with an arbitrary shape and orientation, and is applied to edge‐emitting laser diodes with a complex cavity structure and surface‐emitting laser diodes (SELD). At present, threshold currents for both edge‐emitting and surface‐emitting lasers are similar to that of a conventional ridge‐stripe waveguide laser or proton‐isolated SELD, indicating that there is considerable surface recombination at regrown interfaces. Surface recombination velocity at the regrown interfaces is estimated from the size effect of lasing characteristics.
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