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High‐stability bimorph scanning tunneling microscope

 

作者: B. L. Blackford,   D. C. Dahn,   M. H. Jericho,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1987)
卷期: Volume 58, issue 8  

页码: 1343-1348

 

ISSN:0034-6748

 

年代: 1987

 

DOI:10.1063/1.1139658

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A novel scanning tunneling microscope (STM) is described which is constructed almost entirely of aluminum and uses bimorph piezoelectric disks as thex,y,zdrive elements. The design uses a simple, rugged tripod configuration for the fine motion drive arms. Coarse motion of the sample, which is mounted on an aluminum holder, is achieved by pushing or pulling, with a piezoelectric louse. Differential thermal expansion effects are avoided by design, to first order, and the resulting drift is ≤0.5 A˚/min after only a short warm‐up period. It is easy to build and operate, and has good immunity to mechanical vibrations. The frequency response is flat to 5 kHz. Thex,y,zdrive sensitivity is 8 A˚/V and the range is ≥12000 A˚. Some preliminary experimental results are presented, including atomic resolution images in air, of graphite and NbSe2.

 

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