首页   按字顺浏览 期刊浏览 卷期浏览 Characterization of Nd:Y3Al5O12thin films grown on various substrates by pulsed laser d...
Characterization of Nd:Y3Al5O12thin films grown on various substrates by pulsed laser deposition

 

作者: Mizunori Ezaki,   Minoru Obara,   Hiroshi Kumagai,   Koichi Toyoda,  

 

期刊: Applied Physics Letters  (AIP Available online 1996)
卷期: Volume 69, issue 20  

页码: 2977-2979

 

ISSN:0003-6951

 

年代: 1996

 

DOI:10.1063/1.117749

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Epitaxial Nd‐doped yttrium aluminum garnet (NdxY3−xAl5O12or Nd:YAG) films have been grown on various substrates by pulsed laser deposition for the purpose of fabricating diode‐pumped waveguide lasers. The films were characterized by Rutherford backscattering, x‐ray diffraction, atomic force microscopy, and photoluminescence measurements. Nd:YAG films on (100) silicon substrate with a large lattice mismatch show oriented stoichiometric growth. On the other hand, Nd:YAG films on garnet substrates (NdundopedGd3Ga5O12,Y3Al5O12and Zr‐, Sc‐doped Gd3Ga5O12) show epitaxial growth with smooth surfaces. The optical properties of Nd‐doped YAG thin films on various substrates were comparable to those of Nd:YAG bulk laser crystal. ©1996 American Institute of Physics.

 

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