Characterization of Nd:Y3Al5O12thin films grown on various substrates by pulsed laser deposition
作者:
Mizunori Ezaki,
Minoru Obara,
Hiroshi Kumagai,
Koichi Toyoda,
期刊:
Applied Physics Letters
(AIP Available online 1996)
卷期:
Volume 69,
issue 20
页码: 2977-2979
ISSN:0003-6951
年代: 1996
DOI:10.1063/1.117749
出版商: AIP
数据来源: AIP
摘要:
Epitaxial Nd‐doped yttrium aluminum garnet (NdxY3−xAl5O12or Nd:YAG) films have been grown on various substrates by pulsed laser deposition for the purpose of fabricating diode‐pumped waveguide lasers. The films were characterized by Rutherford backscattering, x‐ray diffraction, atomic force microscopy, and photoluminescence measurements. Nd:YAG films on (100) silicon substrate with a large lattice mismatch show oriented stoichiometric growth. On the other hand, Nd:YAG films on garnet substrates (NdundopedGd3Ga5O12,Y3Al5O12and Zr‐, Sc‐doped Gd3Ga5O12) show epitaxial growth with smooth surfaces. The optical properties of Nd‐doped YAG thin films on various substrates were comparable to those of Nd:YAG bulk laser crystal. ©1996 American Institute of Physics.
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