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Double Activators in Oxide Cathode Base Alloys

 

作者: A. Eisenstein,   H. John,   J. H. Affleck,  

 

期刊: Journal of Applied Physics  （AIP Available online 1953）
卷期: Volume 24, issue 5  

页码: 631-632

 

ISSN:0021-8979

 

年代: 1953

 

DOI:10.1063/1.1721340

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The presence of tungsten as a major impurity in the base metal of an oxide‐coated cathode leads to the formation of the interface Ba3WO6. If silicon is also present, but as a minor impurity, this element gradually replaces tungsten in the interface to form Ba2SiO4. Similar reactions between titanium and aluminum with other known interface compounds were examined.

 

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