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X‐Ray Measurement of Stacking Fault Widths in fcc Metals

 

作者: B. E. Warren,  

 

期刊: Journal of Applied Physics  (AIP Available online 1961)
卷期: Volume 32, issue 11  

页码: 2428-2431

 

ISSN:0021-8979

 

年代: 1961

 

DOI:10.1063/1.1777086

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A generalized derivation of the broadening of powder pattern lines by stacking faults has been carried through allowing for fault planes of arbitrary dimensions. A minimum dimension for the fault planeTminis obtained from the measurable effective particle sizesDe(111) andDe(200). Values ofTminof the order of 200 A are obtained for samples of filings of copper, &agr; brass, and silver. The results suggest that, in the drastic cold work involved in filings, the stacking faults tend to extend over rather large distances comparable to the coherent domain dimensions.

 

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