Scanning tunneling microscope with micrometer approach and thermal compensation
作者:
M. H. Jericho,
D. C. Dahn,
B. L. Blackford,
期刊:
Review of Scientific Instruments
(AIP Available online 1987)
卷期:
Volume 58,
issue 8
页码: 1349-1352
ISSN:0034-6748
年代: 1987
DOI:10.1063/1.1139414
出版商: AIP
数据来源: AIP
摘要:
A scanning tunneling microscope that uses a micrometer coarse approach mechanism is described. The approach mechanism can be decoupled from the rest of the microscope to result in a thermally compensated instrument. Thirty minutes after establishing tunneling, lateral thermal drift in our instrument is down to 0.5 A˚/min. Construction details of the microscope and high resolution images of pyrolytic graphite and 2H‐NbSe2samples are presented.
点击下载:
PDF
(528KB)
返 回