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Microstructure of Thin Single Crystals of Copper

 

作者: L. O. Brockway,   Robert B. Marcus,  

 

期刊: Journal of Applied Physics  （AIP Available online 1963）
卷期: Volume 34, issue 4  

页码: 921-923

 

ISSN:0021-8979

 

年代: 1963

 

DOI:10.1063/1.1729562

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Single‐crystal films of copper of 700–800 Å thickness have been prepared showing high densities of wide stacking faults. Variations in the annealing treatment of the films affect the nature of the imperfections occurring in the film.

 

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