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Frequency factors for the annealing of the electrical resistance changes in deuteron‐bombarded copper

 

作者: William Primak,  

 

期刊: Journal of Applied Physics  (AIP Available online 1979)
卷期: Volume 50, issue 3  

页码: 1279-1286

 

ISSN:0021-8979

 

年代: 1979

 

DOI:10.1063/1.326158

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The results of attempting to fit the step‐annealing data to an activation energy distribution indicate a dispersion of the frequency factor ranging from 107to 1011sec−1which is explained as arising from diffusion processes. The distribution appears to rise gradually to a peak with the possible existence of a subsidiary peak, then a very sharp drop from the peak. This sharp drop indicates the annealing processes are first order. The beginning of the distribution is in accord with its being the residue from annealing during bombardment, subsequent treatment, and storage. It is hypothesized that the gradual rise is associated with the dispersion of the frequency factor.

 

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